By R. L. Heath (auth.), Kurt F. J. Heinrich, Charles S. Barrett, John B. Newkirk, Clayton O. Ruud (eds.)
The software of solid-state detectors of excessive strength answer to x-ray spectrometry, and the expanding use of compu ters in either size and knowledge review, are giving a brand new stimulus to x-ray concepts in analytical chemistry. the 20th Annual Denver X-ray convention displays this renewed curiosity in numerous methods. The invited papers, grouped in consultation I, evaluation the charac teristics of the detectors utilized in the size of x-rays. One paper is devoted to the detection of unmarried ions. even supposing one of these topic might sound to be marginal to the needs of the Denver convention, we needs to realize the affinity of innovations utilized to comparable reasons. Ion probe mass spectrometry is devoted to initiatives just like these played by means of x-ray spectrometry with the electron probe microanalyzer. Scientists and technologists will see those thoughts mentioned within the similar conferences. The dialogue of automation and programming isn't restricted to the 2 invited audio system, yet extends to papers awarded in additional than one consultation. the problem of fluorescence research through isotope- and tube-excitation may also be of significant curiosity to these curious about the sensible functions of x-ray options. The communications contained during this quantity, and the energetic discussions which often the presentation of papers, attest to the energy of the themes that are the worry of the once a year Denver X-ray Conference.
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Extra info for Advances in X-Ray Analysis: Volume 15
All unmarked peaks have a In Fig. 5 Fig. 15. 16 27 28 43 MASS OF ION IN ATOMIC MASS UNITS 54 Ion microprobe scan of oxidized Al conversion dynode on glass. 52 L. A. Dietz by electron beam evaporation of 1000 Aof pure aluminum onto a section of glass microscope slide, at a pressure less than 10- 8 Torr. The freshly-deposited aluminum surface then was exposed to a partial pressure of pureoxygen to form an oxide layer about 10 A thick. Here most of the peaks are combinations of aluminum and oxygen.
12. SIZE 20fL2 Anderson's curves of sputtered ion yield of Al-27+ for Ar-40+ and 0-32+ bombarding ions. 50 L. A. Dietz ALUMINUM 40Ar + 32 0+ 4 4 3 3 2 2 16 0' INTENSITY (ARBIT. ) ACCEL. POTENTIAL 14 KV SAMPLE CURRENT "w 5x10- 7 A Fig. 13. Anderson's curvesof sputtered ion yields of 0-16for bombarding ion beams of Ar-40+ and 0-32+. away, are not as highly oxidized as deeper layers and therefore have lower yield. The intensity of sputtered Al-27+ remains constant after the initial mean depth of implanted oxygen ions has been exceeded.
In this figure are two cases. On the righthand side of the figure a single peak is shown, with all experimental quantities defined. r::. r. 104 c & u • J I, COIT'ojlOnefII$ LSPfC,rO' Y. ",d ~~~~~~~~b·4f~"~--~~~·~~~~IW~'~~~~ __ o ____________ '. I ________________ 2300 Chomel __ 2400 ___ Gauss,,,,, Peak Sptctrol BockQround ____________________ 2'00 Fig. 17. Plot of typical pulse-height spectrum illustrating technique for fitting data to determine peak position and area. experimental points with a straight line background subtraction.