Fault Diagnosis of Analog Integrated Circuits (Frontiers in by Prithviraj Kabisatpathy

By Prithviraj Kabisatpathy

Allows the reader to check an analog circuit that's applied both in bipolar or MOS know-how. Examines the checking out and fault prognosis of analog and analog a part of combined sign circuits. Covers the trying out and fault analysis of either bipolar and steel Oxide Semiconductor (MOS) circuits and introduces . additionally comprises difficulties that may be used as quiz or homework.

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Additional info for Fault Diagnosis of Analog Integrated Circuits (Frontiers in Electronic Testing)

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592-597, October 1990. N. Nagi, A. Chatterjee, A. A. Abraham, “Fault-based automatic test generator for linear analog circuits”, Digest of Papers, IEEE/ACM International Conference on Computer-Aided Design (ICCAD-93), pp. 88-91, November 1993. G. Devarayanadurg and M. Soma, “Analytical fault modeling and static test generation for analog circuits”, Digest of Papers, IEEE/ACM International Conference on Computer-Aided Design (ICCAD-94), pp. 44-47, November 1994. G. Devarayanadurg and M. Soma, “Dynamic test signal design for analog integrated circuits”, Digest of Papers, IEEE/ACM International Conference on Computer-Aided Design (ICCAD-95), pp.

3. 4. What are the different types of failure possible in an electronic component? How do the layout off an integrated circuit and its packages affect failure of the device? Why does the CMOS short circuit simulation use a resistor instead of zero resistance? Count the possible number of catastrophic faults for the circuit of Fig. 3 Show that the interest compounded annually over a particular number of years on a principal could be expressed as a polynomial of the interest rate per annum, r. The cumulative increase in the principal, R, could be expressed with an r0 component included.

In this case the results of the random approach with comparable cost may be superior. The methods for test pattern generation are highly correlated with the types of test pattern discussed above. In the following sections some common approaches are discussed which may be suitable for analog test stimulus generation. 2 ffault diagnosis of analog integrated circuits Conventional analog test stimulus generation In general, analog testing and fault diagnosis problem may be broken down in two aspects.

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