Handbook of Micro/Nano Tribology, Second Edition by Bharat Bhushan

By Bharat Bhushan

This moment version of guide of Micro/Nanotribology addresses the fast evolution inside of this box, serving as a reference for the amateur and the professional alike. components divide this guide: half I covers uncomplicated reviews, and half II addresses layout, building, and functions to magnetic garage units and MEMS.
Discussions include:

  • surface physics and strategies for bodily and chemically characterizing sturdy surfaces
  • roughness characterization and static touch versions utilizing fractal analysis
  • sliding on the interface and friction on an atomic scale
  • scratching and put on due to sliding
  • nanofabrication/nanomachining in addition to nano/picoindentation
  • lubricants for minimizing friction and wear
  • surface forces and microrheology of skinny liquid films
  • measurement of nanomechanical houses of surfaces and skinny films
  • atomic-scale simulations of interfacial phenomena
  • micro/nanotribology and micro/nanomechanics of magnetic garage devices
    This finished publication comprises sixteen chapters contributed through greater than 20 overseas researchers. In each one bankruptcy, the presentation starts off with macroconcepts after which bring about microconcepts. With greater than 500 illustrations and 50 tables, instruction manual of Micro/Nanotribology covers the diversity of proper issues, together with characterization of reliable surfaces, dimension recommendations and functions, and theoretical modeling of interfaces.

    What's New within the moment version? New chapters on:
  • AFM instrumentation
  • Surface forces and adhesion
  • Design and building of magnetic garage devices
  • Microdynamical units and systems
  • Mechanical houses of fabrics in microstructure
  • Micro/nanotribology and micro/nanomechanics of MEMS devices
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    Extra resources for Handbook of Micro/Nano Tribology, Second Edition

    Sample text

    Upon increasing the force from 10 pN, Ohnesorge and Binnig (1993) observed that monatomic steplines were slowly wiped away and a perfectly ordered structure was left. This observation explains why mostly defectfree atomic resolution has been observed with AFM. We note that for atomic-resolution measurements the cantilever should not be too soft to avoid jumps. We further note that measurements in the attractiveforce imaging mode may be desirable for imaging with atomic resolution. The key component in AFM is the sensor for measuring the force on the tip due to its interaction with the sample.

    From Kaneko, R. et al. (1988), J. Vac. Sci. , A6, 291–292. ) the cantilever reflection. The coupler directs half of the total reflected light to lead 4 and into the signal 2 photodiode where the intensity of the optical interference is measured. To reduce reflections from the ends of leads 3 and 4, the fibers were cleaved at a nonorthogonal angle and an index-matching liquid was placed between the photodiodes and the fiber ends. , 1989). AFMs can be used to obtain topographic images using repulsive contact forces as well as attractive electrostatic forces.

    24WTLρ)]1/2 where E is the Young’s modulus, mc is the concentrated mass of the tip, and ρ is the mass density of the cantilever (Sarid and Elings, 1991). For Si3N4, E = 150 GPa and ρ = 3100 kg/m3. Data provided by Park Scientific Instruments. 15 175 116 Note: kz = EWT 3/4L3, ky = EW 3T/4l3, and kyT = GWT 3/3Ll2, where E is Young’s modulus and G is the modulus of rigidity [ = E/2(1 + ν), where ν is Poisson’s ratio]. For Si, E = 130 GPa and G = 50 GPa. From Park Scientific Instruments and Meyer, G.

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