Noncontact Atomic Force Microscopy: Volume 2 by Seizo Morita (auth.), Seizo Morita, Franz J. Giessibl,

By Seizo Morita (auth.), Seizo Morita, Franz J. Giessibl, Roland Wiesendanger (eds.)

Since the unique book of Noncontact Atomic strength Microscopy in 2002, the noncontact atomic strength microscope (NC-AFM) has accomplished awesome development. This moment therapy offers with the next extraordinary fresh effects acquired with atomic solution due to the fact then: strength spectroscopy and mapping with atomic solution; tuning fork; atomic manipulation; magnetic alternate strength microscopy; atomic and molecular imaging in drinks; and different new applied sciences. those effects and applied sciences are actually aiding evolve NC-AFM towards functional instruments for characterization and manipulation of person atoms/molecules and nanostructures with atomic/subatomic solution. for this reason, the ebook exemplifies how NC-AFM has develop into an important instrument for the increasing fields of nanoscience and nanotechnology.

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Sometimes, gentle contacts with the surface are required to improve atomic resolution image quality or to stabilize the tip apex after unintended modifications during scanning or force spectroscopy measurements. If the tip is producing stable imaging and good force spectroscopy data, it can be used over several measurement sessions without any further cleaning treatment. When using cantilevers and a detection system based on optical interferometry, higher sensitivity is obtained by positioning the laser spot as close as possible to the cantilever-free end, while keeping a good and stable oscillation 34 O.

Applying the timing diagram of Fig. 3), room temperature spectroscopic measurements on an Si(111)-(7 × 7) surface are demonstrated in Fig. 5 [11]. In this experiment, 80 curves were acquired. Ten of these Δf –Z (a forward and a backward curve from each acquisition interval) are displayed in Fig. 5a by gray lines. They overlap with a very low dispersion. In the absence of tip apex and/or surface changes, this close similarity among the curves allows us to average them in a single curve for a further reduction of noise.

Gonzalez, V. Chab, Phys. Rev. B 77, 125104 (2008) 9. Y. Sugimoto, M. Abe, K. Yoshimoto, O. Custance, I. Yi, S. Morita, Appl. Surf. Sci. 241, 23 (2005) 10. A. Ohiso, M. Hiragaki, K. Mizuta, Y. Sugimoto, M. Abe, S. Morita, e-J. Surf. Sci. Nanotechnol. 26, 79 (2008) 11. N. Oyabu, O. Custance, I. Yi, Y. Sugawara, S. Morita, Phys. Rev. Lett. 90, 176102 (2003) 12. N. Oyabu, Y. Sugimoto, M. Abe, O. Custance, S. Morita, Nanotechnology 16, S112 (2005) 13. Y. Sugimoto, M. Abe, S. Hirayama, N. Oyabu, O. Custance, S.

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