Robust Computing with Nano-scale Devices: Progresses and by Chao Huang

By Chao Huang

Powerful Nano-Computing makes a speciality of numerous problems with powerful nano-computing, defect-tolerance layout for nano-technology at diverse layout abstraction degrees. It addresses either redundancy- and configuration-based equipment in addition to fault detecting ideas throughout the improvement of exact computation versions and instruments. The contents current an insightful view of the continuing researches on nano-electronic units, circuits, architectures, and layout equipment, in addition to supply promising instructions for destiny learn.

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High-performance CMOS variability in the 65-nm regime and beyond,” IBM Journal of Research and Development, vol. 50, no. 4/5, pp. 433–449, July–September 2006. 15. Han, J. , “A system architecture solution for unreliable nanoelectronic devices,” IEEE Transactions on Nanotechnology, vol. 1, no. 4, December 2002, pp. 201–208. 16. Hayne, R. , “Behavioral Fault Modeling in a VHDL Synthesis Environment”, Proceedings of the IEEE VLSI Test Symposium, Dana Point, California, April 25–29, 1999, pp. 333–340.

2. , “Detecting and Locating Faults in VLSI Implementations of the Advanced Encryption Standard,” in Proc. of the IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, pp. 105–113, Nov. 2003. Fault Tolerant Nanocomputing 25 3. Bhaduri, D. , “NANOLAB – A tool for evaluating reliability of defecttolerant nanoarchitectures,” IEEE Transactions on Nanotechnology, vol. 4, no. 4, July 2005, pp. 381–394. 4. , “Comparing reliability-redundancy tradeoffs for two von neuman multiplexing architectures,” IEEE Transactions on Nanotechnology, vol.

A TMR circuit can be further triplicated. The obtained circuit thus has nine copies of the original module and two layers of majority gates. This process can be repeated if necessary, resulting in a technique called cascaded triple modular redundancy (CTMR) or recursive triple modular redundancy (RTMR). Spagocci and Fountain [12] have shown that using CTMR in a nanochip with large nanoscale devices would require an extremely low device error rate. In [13], it is shown that recursive voting leads to a double exponential decrease in a circuit’s failure probability.

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